Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/33Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Baruah, Bhaskarjyoti | - |
| dc.date.accessioned | 2022-12-26T17:04:31Z | - |
| dc.date.available | 2022-12-26T17:04:31Z | - |
| dc.date.issued | 2013 | - |
| dc.identifier.issn | 2278-4861 | - |
| dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/33 | - |
| dc.description.abstract | Nanocrystalline films of PbS have been deposited on glass sustrates at room temperature by CBD method. The structural parameters of PbS films have been studied by X-ray line profile analysis using Williamson Hall and Modified Williamson Hall method. The crystallite sizes are found in between 4.99-53.9 nm, strain in the films in the range of 7.4x10-4 – 2.82 x 10-3 and dislocation densities are found to be very high ~ 1015-1016 m-2. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | IOSR Journal of Applied Physics (IOSR-JAP) | en_US |
| dc.title | X-Ray Line Profile Analysis of Chemically Deposited Nanostructured PBS Films | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | College Faculty Publications | |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.