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http://localhost:8080/xmlui/handle/123456789/33| Title: | X-Ray Line Profile Analysis of Chemically Deposited Nanostructured PBS Films |
| Authors: | Baruah, Bhaskarjyoti |
| Issue Date: | 2013 |
| Publisher: | IOSR Journal of Applied Physics (IOSR-JAP) |
| Abstract: | Nanocrystalline films of PbS have been deposited on glass sustrates at room temperature by CBD method. The structural parameters of PbS films have been studied by X-ray line profile analysis using Williamson Hall and Modified Williamson Hall method. The crystallite sizes are found in between 4.99-53.9 nm, strain in the films in the range of 7.4x10-4 – 2.82 x 10-3 and dislocation densities are found to be very high ~ 1015-1016 m-2. |
| URI: | http://localhost:8080/xmlui/handle/123456789/33 |
| ISSN: | 2278-4861 |
| Appears in Collections: | College Faculty Publications |
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